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SID4 HR
Spectral Range VIS - NIR (400 - 1100 nm)
The SID4 HR brings ultra-high phase sampling (416 x 360) and high dynamic range (500 µm PV) to the most demanding wavefront measurement applications. Its large aperture and extreme wavefront sensitivity makes it perfectly suited to direct measurement of large diverging beams without relay optics.
Key Features
- Very high resolution (416 x 360 phase pixels)
- Large analysis pupil: 9.98 x 8.64 mm²
- Direct measurement of high NA beam up to 0.8
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment • Material inspection •
Specifications
| Wavelength range | 400 - 1100 nm |
| Aperture dimension | 9.98 x 8.64 mm² |
| Spatial resolution | 24 µm |
| Phase and Intensity sampling | 416 x 360 |
| Resolution (Phase) | <2 nm RMS |
| Accuracy | 20 nm RMS |
| Acquisition rate | 10 fps |
| Real-time processing frequency* | 2 fps (full resolution) |
| Interface | Giga Ethernet |
| Dimensions (WxHxL) | 80 x 77.5 x 86.4 mm³ |
| Weight | ~600 g |
*with SID4 Software
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Related Markets
• High-intensity laser facilities • Optical components and assemblies • Material science • AR/VR • Astronomy • Aerospace • Defense •