SID4-HR

Spectral Range VIS - NIR (400 - 1100 nm)

Phasics SID4-HR wavefront sensor

The SID4-HR brings ultra-high phase sampling (400 x 300) and high dynamic range (500 µm PV) to the most demanding wavefront measurement applications. Its large aperture and extreme wavefront sensitivity makes it perfectly suited to direct measurement of large diverging beams without relay optics.

Key Features

  • Very high resolution (400 x 300 phase pixels)
  • Large analysis pupil: 11.8 x 8.9 mm²
  • Direct measurement of high NA beam up to 0.8

Applications

Laser testing, adaptive optics, and plasma diagnostics  Optics metrology and optical system alignment Material inspection

Specifications

Wavelength range 400-1100 nm
Aperture dimension 11.84 x 8.88 mm²
Spatial resolution 29.6 µm
Phase and Intensity sampling 400 x 300
Resolution (Phase) 2 nm RMS
Accuracy 15 nm RMS
Acquisition rate 10 fps
Real-time processing frequency* 3 fps (full resolution)
Interface Giga Ethernet
Dimensions (WxHxL) 54 x 46 x 79 mm³
Weight ~250 g

*with SID4 Software

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