Spectral Range VIS - NIR (400 - 1100 nm)

Phasics SID4 HR wavefront sensor

The SID4 HR brings ultra-high phase sampling (416 x 360) and high dynamic range (500 µm PV) to the most demanding wavefront measurement applications. Its large aperture and extreme wavefront sensitivity makes it perfectly suited to direct measurement of large diverging beams without relay optics.

Key Features

  • Very high resolution (416 x 360 phase pixels)
  • Large analysis pupil: 9.98 x 8.64 mm²
  • Direct measurement of high NA beam up to 0.8


Laser testing, adaptive optics, and plasma diagnostics  Optics metrology and optical system alignment Material inspection


Wavelength range 400 - 1100 nm
Aperture dimension 13.3 x 13.3 mm²
Spatial resolution 24 µm
Phase and Intensity sampling 416 x 360
Resolution (Phase) < 2 nm RMS
Accuracy 20 nm RMS
Acquisition rate 10 fps
Real-time processing frequency* > 3 fps (full resolution)
Interface Giga Ethernet
Dimensions (WxHxL) 73 x 71 x 90 mm³
Weight ~ 450 g

*with PhaseStudio Software

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