SID4-SWIR

Spectral Range SWIR (900 - 1700 nm)

Phasics SID4-SWIR wavefront sensor

The SID4-SWIR wavefront sensor integrates Phasics' patented technology with an InGaAs detector. Thanks to its high spatial resolution (80 x 64 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7μm. The SID4-SWIR is an innovative solution for testing SWIR optical systems used in optical communications, inspection instruments or night vision in military and surveillance devices.

Key Features

  • High resolution – 80 x 64 phase pixels
  • High sensitivity – compatible with low energy IR sources
  • Compact and self-referenced for easy set-up
     

Applications

Laser testing, adaptive optics, and plasma diagnostics Optics metrology and optical system alignment

Specifications

Wavelength range 0.9 -1.7 µm
Aperture dimension 9.60 x 7.68 mm²
Spatial resolution 120 µm
Phase and Intensity sampling 80 x 64
Resolution (Phase) < 2 nm RMS
Accuracy (Absolute) 15 nm RMS
Acquisition rate 120 fps
Real-time processing frequency* 7 fps (full resolution)*
Interface Giga Ethernet
Dimensions (WxHxL) 100 x 55 x 63 mm³
Weight ~500 g

*with SID4 Software

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