The SID4-SWIR wavefront sensor integrates Phasics' patented technology with an InGaAs detector. Thanks to its high spatial resolution (80 x 64 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7μm. The SID4-SWIR is an innovative solution for testing SWIR optical systems used in optical communications, inspection instruments or night vision in military and surveillance devices.
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Wavelength range | 0.9 -1.7 µm |
Aperture dimension | 9.60 x 7.68 mm² |
Spatial resolution | 120 µm |
Phase and Intensity sampling | 80 x 64 |
Resolution (Phase) | < 2 nm RMS |
Accuracy (Absolute) | 15 nm RMS |
Acquisition rate | 30 fps |
Real-time processing frequency* | 7 fps (full resolution)* |
Interface | Giga Ethernet |
Dimensions (WxHxL) | 100 x 55 x 63 mm³ |
Weight | ~500 g |
*with SID4 Software
• Laser industry • Optical components and assemblies • Aerospace • Free space optical communication • Automotive •