SID4 SWIR

Spectral Range SWIR (900 - 1700 nm)

The SID4 SWIR wavefront sensor integrates Phasics' patented technology with an InGaAs detector. Thanks to its high spatial resolution (80 x 64 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7μm. The SID4 SWIR is an innovative solution for testing SWIR optical systems used in optical communications, inspection instruments or night vision in military and surveillance devices.

Key features

High resolution – 80 x 64 phase pixels
High sensitivity – compatible with low energy IR sources
Compact and self-referenced for easy set-up

Applications

Specifications

Wavelength range	0.9 - 1.7 µm
Aperture dimension	9.60 x 7.68 mm²
Spatial resolution	120 µm
Phase and Intensity sampling	80 x 64
Resolution (Phase)	< 2 nm RMS
Accuracy (Absolute)	15 nm RMS
Acquisition rate	30 fps
Real-time processing frequency*	> 7 fps (full resolution)*
Interface	Giga Ethernet
Dimensions (WxHxL)	58 x 65 x 95 mm³
Weight	~ 500 g