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SID4 SWIR
Spectral Range SWIR (900 - 1700 nm)
The SID4 SWIR wavefront sensor integrates Phasics' patented technology with an InGaAs detector. Thanks to its high spatial resolution (80 x 64 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7μm. The SID4 SWIR is an innovative solution for testing SWIR optical systems used in optical communications, inspection instruments or night vision in military and surveillance devices.
Key Features
- High resolution – 80 x 64 phase pixels
- High sensitivity – compatible with low energy IR sources
- Compact and self-referenced for easy set-up
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Specifications
| Wavelength range | 0.9 - 1.7 µm |
| Aperture dimension | 9.60 x 7.68 mm² |
| Spatial resolution | 120 µm |
| Phase and Intensity sampling | 80 x 64 |
| Resolution (Phase) | < 2 nm RMS |
| Accuracy (Absolute) | 15 nm RMS |
| Acquisition rate | 30 fps |
| Real-time processing frequency* | > 7 fps (full resolution)* |
| Interface | Giga Ethernet |
| Dimensions (WxHxL) | 58 x 65 x 95 mm³ |
| Weight | ~ 500 g |
*with SID4 Software
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Related Markets
• Laser industry • Optical components and assemblies • Aerospace • Free space optical communication • Automotive •