Spectral Range SWIR (900 - 1700 nm)

Phasics SID4 SWIR wavefront sensor

The SID4 SWIR wavefront sensor integrates Phasics' patented technology with an InGaAs detector. Thanks to its high spatial resolution (80 x 64 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7μm. The SID4 SWIR is an innovative solution for testing SWIR optical systems used in optical communications, inspection instruments or night vision in military and surveillance devices.

Key Features

  • High resolution – 80 x 64 phase pixels
  • High sensitivity – compatible with low energy IR sources
  • Compact and self-referenced for easy set-up


Laser testing, adaptive optics, and plasma diagnostics Optics metrology and optical system alignment


Wavelength range 0.9 - 1.7 µm
Aperture dimension 9.60 x 7.68 mm²
Spatial resolution 120 µm
Phase and Intensity sampling 80 x 64
Resolution (Phase) < 2 nm RMS
Accuracy (Absolute) 15 nm RMS
Acquisition rate 30 fps
Real-time processing frequency* > 7 fps (full resolution)*
Interface Giga Ethernet
Dimensions (WxHxL) 58 x 65 x 95 mm³
Weight ~ 500 g

*with PhaseStudio Software


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