SID4-SWIR
Spectral Range SWIR (900 - 1700 nm)
The SID4-SWIR wavefront sensor integrates Phasics' patented technology with an InGaAs detector. Thanks to its high spatial resolution (80 x 64 phase pixels) and high sensitivity, it offers accurate wavefront measurement from 900 nm to 1.7μm. The SID4-SWIR is an innovative solution for testing SWIR optical systems used in optical communications, inspection instruments or night vision in military and surveillance devices.
Key Features
- High resolution – 80 x 64 phase pixels
- High sensitivity – compatible with low energy IR sources
- Compact and self-referenced for easy set-up
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Specifications
| Wavelength range | 0.9 -1.7 µm |
| Aperture dimension | 9.60 x 7.68 mm² |
| Spatial resolution | 120 µm |
| Phase and Intensity sampling | 80 x 64 |
| Resolution (Phase) | < 2 nm RMS |
| Accuracy (Absolute) | 15 nm RMS |
| Acquisition rate | 30 fps |
| Real-time processing frequency* | 7 fps (full resolution)* |
| Interface | Giga Ethernet |
| Dimensions (WxHxL) | 100 x 55 x 63 mm³ |
| Weight | ~500 g |
*with SID4 Software
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Related Markets
• Laser industry • Optical components and assemblies • Aerospace • Free space optical communication • Automotive •