SID4-eSWIR

Spectral Range SWIR (900 - 1700 nm)

Phasics SID4-eWIR wavefront sensor

The SID4-eSWIR wavefront sensor integrates Phasics' patented technology with a T2SL detector and is the only high-resolution wavefront sensor covering the extended SWIR range from 1.0 to 2.35 µm. SID4-eSWIR is an innovative solution for testing SWIR sources and lenses used in optical communications, inspection instruments, or night vision in military and surveillance devices.

Key Features

  • Extended spectral range from 1.0 to 2.35 µm
  • High resolution – 80 x 64 phase pixels
  • Compact and self-referenced for easy setup

Applications

Laser testing, adaptive optics, and plasma diagnostics Optics metrology and optical system alignment

Specifications

Wavelength range 0.9 - 2.35 µm
Aperture dimension 9.60 x 7.68 mm²
Spatial resolution 120 μm
Phase and Intensity sampling 80 x 64
Resolution (Phase) < 6 nm RMS*
Accuracy (Absolute) < 40 nm RMS*
Real-time processing frequency 10 Hz (full resolution)
Interface USB 2.0
Dimensions (WxHxL) 90 x 115 x 120 mm³
Weight ~1.8 kg

* for coherent sources

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