SID4-eSWIR
Spectral Range SWIR (900 - 1700 nm) eSWIR (1.7 - 2.35 µm)
The SID4-eSWIR wavefront sensor integrates Phasics' patented technology with a T2SL detector and is the only high-resolution wavefront sensor covering the extended SWIR range from 1.0 to 2.35 µm. SID4-eSWIR is an innovative solution for testing SWIR sources and lenses used in optical communications, inspection instruments, or night vision in military and surveillance devices.
Key Features
- Extended spectral range from 1.0 to 2.35 µm
- High resolution – 80 x 64 phase pixels
- Compact and self-referenced for easy setup
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Specifications
| Wavelength range | 0.9 - 2.35 µm |
| Aperture dimension | 9.60 x 7.68 mm² |
| Spatial resolution | 120 μm |
| Phase and Intensity sampling | 80 x 64 |
| Resolution (Phase) | < 6 nm RMS* |
| Accuracy (Absolute) | < 40 nm RMS* |
| Real-time processing frequency | 10 Hz (full resolution) |
| Interface | USB 2.0 |
| Dimensions (WxHxL) | 90 x 115 x 120 mm³ |
| Weight | ~1.8 kg |
* for coherent sources
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Related Markets
• Laser industry • Optical components and assemblies • Aerospace • Free space optical communication • Automotive •