SID4 eSWIR
Spectral Range SWIR (900 - 1700 nm) eSWIR (1.7 - 2.35 µm)
The SID4 eSWIR wavefront sensor integrates Phasics' patented technology with a T2SL detector and is the only high-resolution wavefront sensor covering the extended SWIR range from 0.9 to 2.35 µm. SID4 eSWIR is an innovative solution for testing SWIR sources and lenses used in optical communications, inspection instruments, or night vision in military and surveillance devices.
Key Features
- Extended spectral range from 0.9 to 2.35 µm
- High resolution – 80 x 64 phase pixels
- Compact and self-referenced for easy setup
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Specifications
| Wavelength range | 0.9 - 2.35 µm |
| Aperture dimension | 9.60 x 7.68 mm² |
| Spatial resolution | 120 μm |
| Phase and Intensity sampling | 80 x 64 |
| Resolution (Phase) | < 6 nm RMS* |
| Accuracy (Absolute) | < 40 nm RMS* |
| Real-time processing frequency | 10 Hz (full resolution) |
| Interface | USB 2.0 |
| Dimensions (WxHxL) | 90 x 115 x 120 mm³ |
| Weight | ~1.8 kg |
* for coherent sources
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Related Markets
• Laser industry • Optical components and assemblies • Aerospace • Free space optical communication • Automotive •