Optics & Systems Metrology Publications

Optical assembly testing and alignment

Optical test bench for high precision metrology and alignment of zoom sub-assembly components

2013 Proc. SPIE, Vol.8884, Optifab 88841M

DOI: 10.1117/12.2031635 
F.Leprêtre, E.Levillain, B.Wattellier, P.Delage, D.Brahmi, A.Gascon

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Thermal infrared optical metrology using quadri-wave lateral shearing interferometry

2008 Proc. SPIE, Vol.7113, Electro-Optical and Infrared Systems. Technology and Applications V. 71130X
DOI: 10.1117/12.800325
S.Velghe, D.Brahmi, W.Boucher, B.Wattellier, et al

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Recent developments in IR metrology using quadri wave lateral shearing interferometry

2015 Proc. SPIE, Vol.9633, Optifab, 96331T

DOI:10.1117/12.2195806 
W. Boucher, E. Homassel, G. Bourgeois, M. Deprez, B. Wattellier

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Large field of view lens metrology

Automated full-field range OPD and MTF measurement bench for automotive objective benchmark

 

2015 Proc. SPIE, Vol.9633, Optifab, 96331U

DOI: 10.1117/12.2195805
W.Boucher, M.Yonnet, D.Brahmi, A.Gascon, M.Deprez, B.Wattellier, O.Lavergne

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Intraocular lens characterization using a quadric-wave lateral shearing interferometer wavefront sensor

2008 Proc.SPIE, Vol.7102, Optical Fabrication,Testing and Metrology III, 71020Q 
DOI: 10.1117/12.797682 
W.Boucher, S.Velghe, B.Wattellier, D.Gatinel M.D.

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Optical coatings, filters and polarizing optics

Multi-wavelength large optics wavefront error metrology bench (Conference presentation)

2019 Proc.SPIE, Vol.11116, Astronomical Optics: Design and Test of Space and Ground Systems II; 111160V 
DOI:10.1117/12.2528871 
W.Boucher, B.Wattellier, V.D.Genuer
 

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Multi-wavelength large optics wavefront error metrology bench

 

2017 Optical Design and Fabrication, OSA Technical Digest paper OM2B.2.

DOI: 10.1364/OFT.2017.OM2B.2 
W.Boucher, E.Homassel, and B.Wattellier
 

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Ultralow-loss geometric phase and polarization shaping by ultrafast laser writing in silica glass

2020 Light: Science & Applications Vol. 9, Article n° 15

DOI: 10.1038/s41377-020-0250-y
M.Sakakura, Y.Lei, L.Wang, Y-H.Yu & P.G.Kazansky 

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Optics testing

Optical test bench for high precision metrology and alignment of zoom sub-assembly components

 

2013 Proc. SPIE, Vol.8884, Optifab 88841M
DOI: 10.1117/12.2031635 
F.Leprêtre, E.Levillain, B.Wattellier, P.Delage, D.Brahmi, A.Gascon

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Wavefront sensor solution for optical design prototyping and manufacture check in production

 

2014 Classical Optics, OSA Technical Digest,paper OW2B.3.
DOI:10.1364/OFT.2014.OW2B.3
B.Wattellier, P.Delage, D.Brahmi, A.Gascon, and Y.Priol

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On-axis and off-axis characterization of MWIR and LWIR imaging systems using quadri-wave interferometry

2012 Proc.SPIE, Vol.8355, Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII; 83550B
DOI:10.1117/12.919204
S.Velghe, D.Brahmi, W.Boucher, B.Wattellier

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Surface measurement

Aspherical surface measurement using quadri-wave lateral shearing interferometry

2011 Proc.SPIE, Vol.8082, Optical Measurement Systems for Industrial Inspection VII; 80821E
DOI:10.1117/12.895005
W.Boucher, P.Delage, B.Wattellier

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Multi-wavelength large optics wavefront error metrology bench

 

2017 Optical Design and Fabrication, OSA Technical Digest paper OM2B.2.

DOI: 10.1364/OFT.2017.OM2B.2 
W.Boucher, E.Homassel, and B.Wattellier

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Multi-wavelength large optics wavefront error metrology bench (Conference Presentation)

2019 Proc.SPIE,Vol.11116, Astronomical Optics: Design and Test of Space and Ground Systems II; 111160V
DOI: 10.1117/12.2528871
W.Boucher, B.Wattellier, V.D.Genuer

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Metaoptics and metasurfaces

High-resolution single-shot refractive index variation measurement using quadriwave lateral shearing interferometry

2020 Proc.SPIE, Vol.11290, High Contrast Metastructures IX, 112901J
DOI:10.1117/12.2544303
A.Federici, S.Aknoun, W.Boucher, B.Wattellier

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Metasurface optical characterization using quadriwave lateral shearing interferometry

 

2020 Physics Optics
DOI:arXiv:2008.11369v1
S.Khadir, D.Andrén, R.Verre, Q.Song, S.Monneret, et al

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Ultralow-loss geometric phase and polarization shaping by ultrafast laser writing in silica glass

2020 Light: Science & Applications Vol. 9, Article n° 15
DOI: 10.1038/s41377-020-0250-y
M.Sakakura, Y.Lei, L.Wang, Y-H.Yu & P.G.Kazansky 

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Environnmental testing

Multi-wavelength large optics wavefront error metrology bench (Conference Presentation)

2019 Proc.SPIE, Vol.11116, Astronomical Optics: Design, and Test of Space and Ground Systems II; 111160V 
DOI:10.1117/12.2528871
W.Boucher, B.Wattellier, V.D.Genuer

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High vacuum compatible wavefront sensor for focal spot diagnostics and optimization

2019 CLEO/Europe-EQEC), Munich, Germany, pp. 1-1

DOI:10.1109/CLEOE-EQEC.2019.8872754
I.Doudet, B.Wattellier and L.Meignien

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