SID4 UV HR
Spectral Range UV (190 - 400 nm)
Based on Phasics' patented technology, the SID4 UV HR wavefront sensor offers both an unrivalled high resolution (355 x 280 measurement points) and a very high sensitivity (1 nm RMS) in the ultraviolet spectrum from 190 nm to 400 nm. Consequently, the SID4 UV HR is perfectly adapted for optical component characterization (used in lithography, semiconductors…) and surface inspection (lens and wafers...).
Key Features
- Sensitive down to 190 nm
- High sensitivity – 1 nm RMS
- Very high resolution (355 x 280 sampling)
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Specifications
SID4-UV-HR
| Wavelength range | 190 - 400 nm |
| Aperture dimension | 13.84 x 10.88 mm² |
| Spatial resolution | 38.88 µm |
| Phase and intensity sampling | 355 x 280 |
| Resolution (Phase) | 1 nm RMS |
| Accuracy (Absolute) | 10 nm RMS |
| Acquisition rate | 30 fps |
| Real-time processing frequency* | 3 fps (full resolution)* |
| Interface | Camera Link |
| Dimensions (WxHxL) | 78 x 88.1 x 70.8 mm³ |
| Weight | ~575g |
*with SID4 software
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Related Markets
• Laser industry • Optical components & assemblies • AR/VR • Astronomy • Aerospace • Semiconductor •