Bringing high-resolution wavefront sensing as low as 250 nm, the SID4-UV is perfectly suited for UV optics testing, UV laser characterization (used in lithography or semiconductor applications), and surface inspection of lenses and wafers.
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Wavelength range | 250 - 400 nm |
Aperture dimension | 7.4 x 7.4 mm² |
Spatial resolution | 29.6 µm |
Phase and Intensity sampling | 250 x 250 |
Resolution (Phase) | 2 nm RMS |
Accuracy (Absolute) | 10 nm RMS |
Acquisition rate | 30 fps |
Real-time processing frequency* | > 2 fps (full resolution)* |
Interface | Giga Ethernet |
Dimensions (WxHxL) | 78 x 88.1 x 71.1 mm³ |
Weight | ~575g |
*with SID4 Software
• Laser industry • Semiconductor • Astronomy • Aerospace • Optical components and assemblies •