SID4-UV
Spectral Range UV (190 - 400 nm)
Bringing high-resolution wavefront sensing as low as 250 nm, the SID4-UV is perfectly suited for UV optics testing, UV laser characterization (used in lithography or semiconductor applications), and surface inspection of lenses and wafers.
Key Features
- Very high resolution – 250×250 sampling
- High sensitivity – 2 nm RMS
- Affordable solution for UV wavefront measurement
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Specifications
| Wavelength range | 250 - 400 nm |
| Aperture dimension | 7.4 x 7.4 mm² |
| Spatial resolution | 29.6 µm |
| Phase and Intensity sampling | 250 x 250 |
| Resolution (Phase) | 2 nm RMS |
| Accuracy (Absolute) | 10 nm RMS |
| Acquisition rate | 30 fps |
| Real-time processing frequency* | > 2 fps (full resolution)* |
| Interface | Giga Ethernet |
| Dimensions (WxHxL) | 78 x 88.1 x 71.1 mm³ |
| Weight | ~575g |
*with SID4 Software
Related products
SID4-UV-HR
UV wavefront sensors sensitive down to 190 nm
Based on Phasics' patented technology, the SID4 UV-HR wavefront sensor offers both an unrivalled high resolution (355x280 measurement points) and ...
SID4
Cost-effective, high resolution wavefront sensor
Our entry-level yet high-resolution wavefront sensor covering the visible and NIR range, the SID4 is the perfect versatile tool for ...
SID4-HR
Ultra-high resolution wavefront sensor
The SID4-HR brings ultra-high phase sampling (400 x 300) and high dynamic range (500 µm PV) to the most demanding ...
R-Cube illumination module
Illumination source add-on for double-pass configuration
The R-Cube is an add-on for easy double-pass measurement with Phasics' wavefront sensors. It applies to mirror and large-lens aberration ...
Related Markets
• Laser industry • Semiconductor • Astronomy • Aerospace • Optical components and assemblies •