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SID4 UV
Spectral Range UV (190 - 400 nm)
Bringing high-resolution wavefront sensing as low as 250 nm, the SID4 UV is perfectly suited for UV optics testing, UV laser characterization (used in lithography or semiconductor applications), and surface inspection of lenses and wafers.
Key Features
- Very high resolution – 250 × 250 sampling
- High sensitivity – 2 nm RMS
- Affordable solution for UV wavefront measurement
Applications
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Specifications
| Wavelength range | 190 - 400 nm |
| Aperture dimension | 7.8 x 7.8 mm² |
| Spatial resolution | 26 µm |
| Phase and Intensity sampling | 300 x 300 |
| Resolution (Phase) | 2 nm RMS |
| Accuracy (Absolute) | 10 nm RMS |
| Acquisition rate | > 30 fps |
| Real-time processing frequency* | 2 fps (full resolution)* |
| Interface | Giga Ethernet |
| Dimensions (WxHxL) | 45 x 30 x 100 mm³ |
| Weight | ~ 250g |
*with SID4 Software
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Related Markets
• Laser industry • Semiconductor • Astronomy • Aerospace • Optical components and assemblies •