Kaleo MultiWAVE

Spectral Range UV (190 - 400 nm) VIS - NIR (400 - 1100 nm) SWIR (900 - 1700 nm)

Phasics Kaleo MultiWAVE test station

Phasics is innovating in optical metrology with a new instrument able to measure both transmitted and reflected wavefront error (TWE/RWE). Coated and uncoated optics can be qualified over a diameter of 5.1 inches (130 mm) at their working wavelengths. The Kaleo MultiWAVE is an advantageous alternative and cost-effective solution to the purchase of several interferometers. The system offers a measurement accuracy comparable to Fizeau interferometry.

Key Features

  • Any wavelength on demand: UV - VISIBLE - NIR - SWIR - MWIR - LWIR
  • Multiple wavelenghts on the same test bench
  • Nanometric phase resolution and large dynamics (>500 fringes)

Applications

Optics metrology and optical system alignment

Specifications

SYSTEM

Configuration Double pass
Measurement capability Measurement capability RWE of reflective surfaces TWE of transparent optics
Number of wavelengths per instrument 1 or 2 (standard), up to 8 (custom)
Custom Wavelengths Any wavelength from 193 nm to 14 μm including: UV: 266, 355, 405 nm VIS / NIR: 550, 625, 780, 940, 1050 nm SWIR / MWIR / LWIR: 1.55, 2.0, 3.39, 10.6 µm
Clear Aperture 5.1" (130 mm)
Beam height 108 mm
Alignment system Alignment system Live phase & Zernike coefficients display
Polarization Compatible with depolarizing optics
Alignment FOV +/- 2°
Pupil focus range +/- 2.5 m
Dimensions / Weight 910 x 600 x 260 mm³, 25 kg
Vibration isolation Not necessary

PERFORMANCES (1)

RMS repeatability (2) < 0.7 nm (< λ / 900)
Sample reflectivity range ~4% - 100%

(1) On a 4″ pupil size, with a 625 nm source
(2) 36 sequential measurements are performed on a 4” reference mirror, each being averaged 16 times. A reference is defined as the average of all odd numbered measurements. RMS repeatability is then defined as the average RMS difference plus 2 times the standard deviation of the difference between even numbered measurements and the reference.

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