Our entry-level yet high-resolution wavefront sensor covering the visible and NIR range, the SID4 is the perfect versatile tool for any laser or optical metrology application
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment •
Wavelength range | 400-1100 nm |
Aperture dimension | 4.73 x 3.55 mm² |
Spatial resolution | 29.6 µm |
Phase and Intensity sampling | 160 x 120 (> 19 000 points) |
Resolution (Phase) | < 2 nm RMS |
Accuracy (Absolute) | 10 nm RMS |
Acquisition rate | 60 fps |
Real-time processing frequency* | > 10 fps (full resolution) |
Interface | Giga Ethernet |
Dimensions (WxHxL) | 54 x 46 x 75.3 mm³ |
Weight | ~250 g |
*with SID4 Software
• High-intensity laser facilities • Laser industry • Aerospace • Defense • Quantum computing •