SID4

Spectral Range VIS (400 - 750 nm) NIR (750 - 1100 nm)

Phasics SID4 wavefront sensor

Our entry-level yet high-resolution wavefront sensor covering the visible and NIR range, the SID4 is the perfect versatile tool for any laser or optical metrology application

Key Features

  • High sensitivity - 2 nm RMS
  • Achromaticity from 400-1100 nm without calibration
  • Self-referenced – insensitive to vibrations & easy to align

Applications

Laser testing, adaptive optics, and plasma diagnostics Optics metrology and optical system alignment

Specifications

Wavelength range 400-1100 nm
Aperture dimension 4.73 x 3.55 mm²
Spatial resolution 29.6 µm
Phase and Intensity sampling 160 x 120 (> 19 000 points)
Resolution (Phase) < 2 nm RMS
Accuracy (Absolute) 10 nm RMS
Acquisition rate 60 fps
Real-time processing frequency* > 10 fps (full resolution)
Interface Giga Ethernet
Dimensions (WxHxL) 54 x 46 x 75.3 mm³
Weight ~250 g

*with SID4 Software

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