Kaleo MultiWAVE

Spectral Range UV (190 - 400 nm) VIS - NIR (400 - 1100 nm) SWIR (900 - 1700 nm) MWIR (3 - 5 μm) LWIR (8 -14 μm)

Phasics is innovating in optical metrology with a new instrument able to measure both transmitted and reflected wavefront error (TWE/RWE). Coated and uncoated optics can be qualified over a diameter of 5.1 inches (130 mm) at their working wavelengths. The Kaleo MultiWAVE is an advantageous alternative and cost-effective solution to the purchase of several interferometers. The system offers a measurement accuracy comparable to Fizeau interferometry.

Key features

Any wavelength on demand: UV - VISIBLE - NIR - SWIR - MWIR - LWIR
Multiple wavelengths on the same test bench
Nanometric phase resolution and large dynamics (> 500 fringes)

Applications

Optics metrology and optical system alignment

Specifications

System

Configuration	Double pass
Measurement capability	RWE of reflective surfaces TWE of transparent optics
Number of wavelengths per instrument	1 or 2 (standard), up to 8 (custom)
Custom Wavelengths	Any wavelength from 193 nm to 14 μm including: UV: 266, 355, 405 nm VIS / NIR: 550, 625, 780, 940, 1050 nm SWIR / MWIR / LWIR: 1.55, 2.0, 3.39, 10.6 µm
Clear Aperture	5.1" (130 mm)
Beam height	108 mm
Alignment system	Live phase & Zernike coefficients display
Polarization	Compatible with depolarizing optics
Alignment FOV	+/- 2°
Pupil focus range	+/- 2.5 m
Dimensions / Weight	910 x 600 x 260 mm³, 25 kg
Vibration isolation	Not necessary

Downloads

Performances

RMS repeatability (2)	< 0.7 nm (< λ / 900)
Sample reflectivity range	~4% - 100%

¹ On a 4″ pupil size, with a 625 nm source

² 36 sequential measurements are performed on a 4” reference mirror, each being averaged 16 times. A reference is defined as the average of all odd numbered measurements. RMS repeatability is then defined as the average RMS difference plus 2 times the standard deviation of the difference between even numbered measurements and the reference.