SID4 XHR

Spectral Range VIS - NIR (400 - 1100 nm)

SID4 XHR is a large aperture, extremely high resolution wavefront sensor for advanced optics and laser metrology. It combines simple implementation with a large active area and 1400 × 1000 phase sampling, enabling live full field measurements on large optical components, expanded beams and wide field assemblies. Optimized for surface inspection, high spatial frequency defect detection and optical component characterization, the SID4 XHR supports applications from lenses and objectives to aspherical and freeform optics.

Phasics SID4 XHR wavefront sensor

Key features

  • Large aperture dimension: 38.64 x 27.60 mm²
  • Extremely high phase sampling: 1400 x 1000
  • Achromaticity

Specifications

SID4-XHR

Wavelength range 400 - 1100 nm
Aperture dimension 38.64 x 27.60mm²
Spatial resolution 1400 x 1000
Phase sampling 27.6 μm
Phase resolution 6 nm RMS
Dimensions 114 x 105 x 110 mm
Weight ~1kg

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Related Markets

AR / VR

AR / VR

OEM integration

OEM integration

Optical components and assemblies

Optical components and assemblies

Smartphone

Smartphone

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