SID4-UHR

Spectral Range VIS (400 - 750 nm) NIR (750 - 1100 nm)

SID4-UHR Ultra-High-Resolution wavefront sensor is adapted for optics metrology needs. It combines the SID4 ease of implementation with high sampling and resolution. Its large aperture allows to get a live wavefront measurement over the complete sample under test. The SID4-UHR is optimized for surface inspection (roughness, high frequency defects detection...) and optical components characterization (lens, objective, aspherical and freeform optics...). Built with a high-performance camera it provides incredible precision for laser characterization. The 512 x 512 (option 666 x 666) phase map sampling with such compactness make the SID4-UHR a unique tool for optics and laser metrology in both research and industry fields.

Key Features

Very high resolution
Large analysis pupil: 15 x 15 mm²
Achromaticity

Applications

• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment • Material inspection •

Specifications

Wavelenght range	400-1100 nm
Aperture dimension	15 x 15 mm²
Spatial resolution	29.6 µm (option 22.2 µm)
Phase and Intensity sampling	512 x 512 (option 666 x 666)
Resolution (Phase)	2 nm RMS
Accuracy	15 nm RMS
Acquisition rate	8 fps
Real-time processing frequency*	1 fps (full resolution)
Interface	Giga Ethernet
Dimensions (WxHxL)	60 x 60 x 70 mm³
Weight	~450 g