SID4-UHR Ultra-High-Resolution wavefront sensor is adapted for optics metrology needs. It combines the SID4 ease of implementation with high sampling and resolution. Its large aperture allows to get a live wavefront measurement over the complete sample under test. The SID4-UHR is optimized for surface inspection (roughness, high frequency defects detection...) and optical components characterization (lens, objective, aspherical and freeform optics...). Built with a high-performance camera it provides incredible precision for laser characterization. The 512 x 512 (option 666 x 666) phase map sampling with such compactness make the SID4-UHR a unique tool for optics and laser metrology in both research and industry fields.
• Laser testing, adaptive optics, and plasma diagnostics • Optics metrology and optical system alignment • Material inspection •
Wavelenght range | 400-1100 nm |
Aperture dimension | 15.16 x 15.16 mm² |
Spatial resolution | 29.6 µm (option 22.2 µm) |
Phase and Intensity sampling | 512 x 512 (option 666 x 666) |
Resolution (Phase) | 2 nm RMS |
Accuracy | 15 nm RMS |
Acquisition rate | 8 fps |
Real-time processing frequency* | 1 fps (full resolution) |
Interface | Giga Ethernet |
Dimensions (WxHxL) | 60 x 60 x 70 mm³ |
Weight | ~450 g |
*with SID4 Software
• High-intensity laser facilities • Optical components and assemblies • Material science • AR/VR • Astronomy • Aerospace • Defense •