SID4-UHR

Spectral Range VIS (400 - 750 nm) NIR (750 - 1100 nm)

Phasics SID4-UHR wavefront sensor

SID4-UHR Ultra-High-Resolution wavefront sensor is adapted for optics metrology needs. It combines the SID4 ease of implementation with high sampling and resolution. Its large aperture allows to get a live wavefront measurement over the complete sample under test. The SID4-UHR is optimized for surface inspection (roughness, high frequency defects detection...) and optical components characterization (lens, objective, aspherical and freeform optics...). Built with a high-performance camera it provides incredible precision for laser characterization. The 512 x 512 (option 666 x 666) phase map sampling with such compactness make the SID4-UHR a unique tool for optics and laser metrology in both research and industry fields.

Key Features

  • Very high resolution 
  • Large analysis pupil: 15 x 15 mm²
  • Achromaticity

Applications

Laser testing, adaptive optics, and plasma diagnostics  Optics metrology and optical system alignment Material inspection

Specifications

Wavelenght range 400-1100 nm
Aperture dimension 15 x 15 mm²
Spatial resolution 29.6 µm (option 22.2 µm)
Phase and Intensity sampling 512 x 512 (option 666 x 666)
Resolution (Phase) 2 nm RMS
Accuracy 15 nm RMS
Acquisition rate 8 fps
Real-time processing frequency* 1 fps (full resolution)
Interface Giga Ethernet
Dimensions (WxHxL) 60 x 60 x 70 mm³
Weight ~450 g

*with SID4 Software

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