Spectral Range VIS - NIR (400 - 1100 nm)

Phasics SID4 UHR wavefront sensor

SID4 UHR Ultra-High-Resolution wavefront sensor is adapted for optics metrology needs. It combines the SID4 ease of implementation with high sampling and resolution. Its large aperture allows to get a live wavefront measurement over the complete sample under test. The SID4 UHR is optimized for surface inspection (roughness, high frequency defects detection...) and optical components characterization (lens, objective, aspherical and freeform optics...). Built with a high-performance camera it provides incredible precision for laser characterization. The 554 x 554 phase map sampling with such compactness make the SID4 UHR a unique tool for optics and laser metrology in both research and industry fields.

Key Features

  • Very high resolution 
  • Large analysis pupil: 15.29 x 15.29 mm²
  • Achromaticity


Laser testing, adaptive optics, and plasma diagnostics  Optics metrology and optical system alignment Material inspection


Wavelenght range 400 - 1100 nm
Aperture dimension 15.29 x 15.29 mm²
Spatial resolution 27.6 µm
Phase and Intensity sampling 554 x 554
Resolution (Phase) < 5 nm RMS
Acquisition rate 8 fps
Real-time processing frequency* 1 fps (full resolution)
Interface USB 3.1
Dimensions (WxHxL) 73 x 70.5 x 93.2 mm³
Weight ~475 g

*with PhaseStudio Software


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