Reliable qualification of large CRA & FOV lenses

Modulation transfer function, wavefront error, lens parameters in a single click

Phasics's wavefront sensing technology provides accurate on and off-axis MTF and WFE of objective lenses even with large field of view (FOV) and large chief ray angle (CRA). Metrology solutions are available from the stand-alone wavefront sensor to the fully automated test station. As all of these solutions benefit from Phasics's unique wavefront measurement technology, they perform reliable and comprehensive measurements while staying easy-to-use metrology tools. Lens test stations (integrated machines and optical test benches) and wavefront sensors are available in the UV, NIR, SWIR, MWIR, and LWIR bands. Phasics' metrology tools address the needs for lens quality control in both R&D and production.

• ▽ Measurement setup

  

  Phasics offers an exclusive lens measurement principle in single pass.  The optical setup to perform lens quality control is very simple; the wavefront is directly measured with no relay lens.  Calculations then use light propagation theory to provide both wavefront aberrations and the MTF. The MTF is obtained in a single shot at any frequency without using a target or any scanning. All wavefront aberrations are also provided with this single acquisition. 

• ▽ Automatic field scanning and wavelength change with the Kaleo MTF

  

  Using the same principle, Phasics has developed the Kaleo MTF machine. The user can fully define the measurement process, indicating which measurements shall be done and saved (for example MTF versus field, WFE versus field, lens parameters...). The bench then automatically positions and aligns the lens. No external input parameter is needed to start the measurement and to compute the results. At the end of acquisition, results are displayed and a summary table report is automatically saved.