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In this paper from Purdue University, researchers use a PHASICS wavefront sensor to confirm refractive index measurements of a PVA thin film obtained with their optical fiber sensor.

The fiber sensor they developed allows for the monitoring of the solidification process of a PVA solution.

Read the full paper here: 10.1109/JSEN.2020.3040571

Learn more about PHASICS solutions for refractive index changes measurements by visiting our website: https://www.phasics.com/en/application-areas/material-inspection-waveguide-surface-analysis-lidt/waveguide-metrology-refractive-index-mapping-qpi/

And here, you will find more about what we offer in materials microscopy: https://www.phasics.com/en/application-markets/microscopy/material-science/