News

PHASICS has recently delivered a customized long-wave infrared (LWIR) multi-wavelength wavefront measurement platform to an aerospace customer, providing precise wavefront testing at 8.6 µm, 9.2 µm, and 12 µm within a single, compact device. This solution enables accurate measurement of divergent IR beams across multiple wavelengths, supporting advanced development and alignment of complex infrared optical systems.

Designed around specific customer requirements, the system integrates the SID4-DWIR infrared wavefront sensor renowned for its outstanding environmental robustness and measurement stability. The platform features a streamlined structure and clear optical path, ensuring efficient operation across a broad range of typical infrared applications.

Throughout the project, the PHASICS engineering team worked closely with the client, conducting multiple rounds of technical discussions and on-site optimizations regarding optical architecture, wavelength selection, and environmental adaptation. The system was successfully installed and delivered, with performance meeting and exceeding customer expectations.

Key Technical Highlights

Multi-Wavelength Achromatic Design
The optical path is engineered for intrinsic achromaticity, allowing seamless switching between IR wavelengths while maintaining consistent accuracy and repeatability—without additional algorithmic compensation or optical adjustments. Reliable evaluation of key metrics such as TWE/RWE, aberrations, and MTF is ensured, making it ideal for high-precision, broadband infrared imaging system development.

Infrared One-Stop Solution
The SID4-DWIR is the world’s first commercial high-resolution wavefront sensor supporting both MWIR and LWIR ranges (3–5 µm and 8–14 µm). Its 160 × 120 phase sampling and 68 µm spatial resolution enable high-NA wavefront measurement without relay optics. The sensor is suitable for high-precision testing of IR lasers (3.39 µm, 10.6 µm), blackbody sources, optical components, and complete systems. Its proven vibration resistance and field reliability make it the ideal choice for integration into large-scale IR platforms.

Figure: SID4-DWIR wavefront sensor

Why PHASICS?

Full-Spectrum, One-Stop Measurement
From deep UV (DUV) to long-wave IR (LWIR) (190 nm–14 µm), PHASICS platforms enable fast multi-wavelength switching and consistent, accurate measurements, reducing setup errors and boosting test efficiency.

High Resolution & Dynamic Range
PHASICS' proprietary QWLSI technology delivers higher sensitivity and superior detection of high-order aberrations and fine details—outperforming Shack-Hartmann and conventional interferometers, with exceptional stability for in-situ and high-throughput applications.

Proven Reliability, Easy Integration
Compact and easy to align, PHASICS solutions are field-proven in both semi-automated and fully automated production environments. Real-world performance and compatibility have been validated worldwide.

Global Trust & Engineering Support
With over two decades of experience and ISO 9001 certification, PHASICS supports aerospace, laser, precision optics, semiconductor, quantum, and R&D sectors worldwide. Our engineering team works alongside clients at every step, from requirements analysis and optical design to deployment and training—ensuring seamless integration and lasting value.

Flexible, Modular Standard Solutions
Beyond custom systems, PHASICS offers the Kaleo Kit modular platform for multi-wavelength wavefront testing from deep UV to LWIR. Explore flexible configurations for every R&D or production scenario.

Interested in advancing your IR wavefront measurement capabilities?
Learn more about the SID4-DWIR sensor’s real-world performance by clicking here : Read More.

For more on PHASICS infrared and multi-wavelength solutions, check out these featured articles:

• Successful Delivery of the First 8.7 microns Kaleo Kit
• SID4 SWIR-HR: A Commercial Reference for High-Precision Wavefront Measurement in ELT's SWIR Observations

Contact us to discuss your project or visit our website for detailed technical resources.