Filters and Polarizing Optics Qualification

Transmitted and reflected wavefront error of filters and polarizing optics at the designed wavelength

With Phasics' unique QWLSI patented technology, test your spectral filters at their designed working wavelength as well as polarizing optics with an interferometric precision. Combining achromaticity and polarization independent measurements, Phasics standalone wavefront sensors and integrated test bench provide transmitted wavefront error (TWE) and reflected wavefront error (RWE) measurements of bandpass spectral filters as well as polarizing optics. Simply tune the probe wavelength to match the design wavelength of your optics and it's done!

  • ▽ Transmission Wavefront Error (TWE) measurement setups

    Transmission Wavefront Error (TWE) measurement setups for filters and polarizing optics metrology

    Either using a Kaleo MultiWAVE fully integrated machine or a modular solution from Phasics, TWE measurements are done in a similar double-pass configuration as a standard Fizeau interferometer. Single-pass measurements can also be performed if required. First, a reference measurement is taken using a reference flat. Then, the filter is placed in the beam path to acquire the transmitted wavefront error. The wavelength can be adjusted either using a tunable source or multiple individual sources.

  • ▽ Reflected Wavefront Error (RWE) measurement setups

    Reflected  Wavefront Error (RWE) measurement setups for filters and polarizing optics metrology

    Similarly, RWE measurement can be performed using the Kaleo MultiWAVE machine or cutom-made optical test setup. First, a reference measurement is taken using reference optic, then the reference optic is replaced by the unit under test, and the reflected wavefront error is measured.

 

Measurement examples

transmitted wavefront error measurement on a narrowband optical filter at 780 nm using Kaleo Multiwave and QWSLI technology

TWE | narrow band filter | 780 nm

Surface measurement on a wide bandpass filter at 625 nm using Kaleo Multiwave and QWSLI technology

RWE | wide band filter | 625 nm

Surface measurement at 3 different wavelengths  using Kaleo Multiwave and QWSLI technology

Reflective surface measured at 3 λ

Advantages

Test at the designed wavelength

  • Multiple sources on the same test bench
  • UV, visible, NIR, SWIR, MWIR, LWIR
  • True achromaticity

Unique capabilities

  • Polarization independent
  • Large dynamics
  • RWE and TWE measurements

Straightforward integration

  • Not sensitive to vibrations
  • Plug and play wavefront sensor
  • Small form factor

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