Material Inspection

Optical waveguides, surfaces, and coatings metrology

Phasics' wavefront sensors and quantitative phase imaging cameras are compact, not sensitive to vibrations, and can be integrated with any optical microscope. This makes SID4 the ideal tool to perform on-line and off-line material qualification such as mapping the change of refractive index in transparent materials, laser-induced damage threshold monitoring, optical surface topography measurements, and photothermal imaging on nanoparticles. A broad range of samples can be measured including femtosecond laser-inscribed waveguides, fiber Bragg gratings, micro-structured optical surfaces, optical coatings, nanoparticles …

Surface measurement with SID4 sC8 quantitative phase imaging camera integrated on an optical microscope

3D surface topography measurements

Index of refraction mapping with SID4 sC8 quantitative phase imaging camera integrated on an optical microscope

Optical waveguides metrology & index of refraction mapping

Photothermal imaging with SID4 sC8 quantitative phase imaging camera integrated on an optical microscope

Nanoplasmonics and photothermal imaging

Laser induced damage threshold measurement setup with SID4-HR wavefront sensor imaging a coated surface irradiated by a laser

Laser-Induced Damage Threshold (LIDT) monitoring

Advantages

Insightful measurements

  • Optical path differences (OPD)
  • Changes of index of refraction
  • Surface topography

Seamless integration

  • Plug and play camera-like instrument
  • Compatible with any microscope
  • No need for specific objectives

Powerful capabilities

  • 2D OPD maps in a single acquisition
  • Sub-nanometer sensitivity
  • Insensitive to vibrations

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