 Lateral shearing interferometry an alternative to Shack Hartmann technique for wave front sensing
 PHASICS SID4 product line uses a technology based on a modified Hartmann test to measure wavefront distortions. Using the multi-wave lateral shearing interferometry formalism to analyse the recorded Hartmann grams leads to increase resolution (at least by a factor 4) compared to all other gradient recovery based wave front sensors as Hartmann test and Shack-Hartmann analysers.
Since 1971, Shack Hartmann analysers were the most common gradient recovery based wave. Thanks to the innovating technology, Phasics wavefront sensors combine high resolution and dynamic range from interferometry with compactness from self-referencing.
The high resolution of our device comes from the use of lateral shearing interferometry: the incoming beam is divided in 4 replicas which interfere. Each interference of two of them gives you the phase gradient along one direction. This innovating technology differs from the Shack Hartmann technique which calculates the centroid of the different micro lens focal spot.
To obtain more information about the new alternative to Shack Hartmann technique, click here "SID4", "OASys", "Our Technology".
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