 Phasics, innovating technology for optical metrology
 In optical metrology, the use of light as a measurement tool has grown over the past twenty years. Until recently, the knowledge related to optical metrology that could be extracted from the light interaction with physical objects was limited to specialized activities. The use of the laser in optical metrology has enabled a huge revolution in measurement.
Phasics wave front sensor, based on lateral shearing interferometry, fulfils optical metrology needs. The main features of our sensor are:
- its intrinsic high resolution
- tunable dynamic range
- compactness
- insensitivity to alignment
All of these characteristics are very useful for optical metrology.
Many industries are concerned by optical metrology tools: Fibre Optics, electronics, photonics, microsystems industries.... The innovating technology used in Phasics wave front sensors offer the prospect of significantly improving the measurement results of optical metrology.
For more information on Phasics and optical metrology sensors possibilities click here "SID4", "OASys", "Our Technology", "Applications".
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