Wave front sensors SID4 are associated with a complete electromagnetic field analysis software. It integrates a high resolution phase map and at the same time the intensity profile and the phase map.
 Software description
Phase interpretation modules
- Tilt
- Divergence
- Zernike polynomials
- Legendre polynomials
- Beam alignment assistant
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Beam analysis
- Phase and Intensity
- M² measurement
- Strehl Ratio
- Far-Field analysis
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Ergonomics- Intuitive software
- Multi-user interface
- Automatic mask adjustement
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Beam View (option)- Complete beam analysis
- Intensity profiles
- Gaussian fit
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Software advantages
SID4 high resolution offers an accurate analysis of the results.
Software analyses circular or rectangular pupils and automatically adapts to the right projection base: Zernike or Legendre.
SID4 technology allows an easy alignment procedure: Fourier Transform analysis strongly reduces tip/tilt alignment.
Different users measurement parameters are associated with a specific profile allowing a multi-user access.
With programming module library (Software Development Kit) in Labview and C++, you can include phase measurement and various interpretation modules in your own programs for a customized use.
With Beamview, SID4 allows at the same time laser beam wave front and intensity profiles.
This feature in the software enables making an intensity profile
characterization.
It gives the following information:
Position of intensity maximum from camera centre (in mm,µm)
Position of intensity centroid from camera centre (in mm,µm)
Beam diameter at 1/e2, FWHM
Ellipticity, angle
X,Y and arbitrary line-out Gaussian fit
Results and pictures saved to disk
Background noise processing
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