 PHASICS wave front sensors are based on a very new technology, lateral shearing interferometry. Invented by Jerome Primot from ONERA for IR metrology needs, lateral shearing interferometry was then applied to the characterization of high power laser wavefront and its correction by the LULI (Laboratoire pour l'Utilisation des Lasers Intenses).
Lateral shearing interferometry meets various needs such as laser beam optimisation, metrology, surface high resolution characterisation and vision.
With Phasics wave front sensor based on lateral shearing interferometry, users have access now, at low cost to a very high transverse resolution (128 x 128 measure points), an easy tunable high dynamic range and a very ease of use ( FireWire camera connected to a laptop).
Lateral shearing interferometry combines high resolution and dynamic range from interferometry with compactness from self-referencing.
The lateral shearing interferometry offers new prospects to wave front measurement and correction.
Applications for lateral shearing interferometry technology:
> lateral shearing interferometry for Laser beam characterization
> lateral shearing interferometry for Beam & Focal spot shaping
> lateral shearing interferometry for Metrology
> lateral shearing interferometry for Ophthalmology
For more information on lateral shearing interferometry, click here " SID4", " OASys", " Our Technology" and " Applications".
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