 PHASICS lateral shearing interferometer is based on a very new technology. Invented by Jerome Primot from ONERA for IR metrology needs, lateral shearing interferometry was then applied to the characterization of high power laser wavefront and its correction by the LULI (Laboratoire pour l'Utilisation des Lasers Intenses).
Phasics lateral shearing interferometer product line meets various needs such as laser beam optimisation, metrology, surface high resolution characterisation and vision.
Phasics lateral shearing interferometer, as basic model, offers optimal technical features for applications in laser beam characterisation and metrology.
With Phasics lateral shearing interferometer, users have access now, at low cost to a very high transverse resolution (128 x 128 measure points), an easy tunable high dynamic range and a very ease of use (FireWire camera connected to laptop).
Thanks to this innovating technology, Phasics lateral shearing interferometer combines high resolution and dynamic range from interferometry with compactness from self-referencing.
Applications for Phasics lateral shearing interferometer product line:
> Phasics lateral shearing interferometer for Laser beam characterization
> Phasics lateral shearing interferometer for Beam & Focal spot shaping
> Phasics lateral shearing interferometer for Metrology
> Phasics lateral shearing interferometer for Ophthalmology
For more information on Phasics lateral shearing interferometer, click here "SID4", "OASys", "Our Technology"
and "Applications".
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