Photonics West 2008
22 - 24 January
San José
USA
Information: More info Laser Optics Berlin 2008
17 - 19 March
Berlin
Germany Plus d'infos OPTATEC 2008
17 - 20 June
Frankfurt
Germany Plus d'infos
SID4-High Resolution wave front sensor is adapted for optical metrology needs. It associates the SID4 ease of implementation with ultra high resolution. Dedicated to optical components metrology (lens, objective, aspheric, microlens characterisation,...), it allows sampling on a phase map of 300x400 measurement points and to access high precision.
SID4 HR genuine features
Ultra high sampling resolution (300x400)
High measurement reproducibility
Large analysis pupil (8.9mm / 11.8mm)
High dynamic range
Instantaneous measurement
Optimal signal-to-noise ratio
Insensitive to vibrations
High Resolution advantages
SID4 HR high resolution (300x400 measurements points) is adapted precisely to optical metrology needs.
Using high performance camera, signal-to-noise ratio is very high.
Instantaneous measurement gives an immediate information (120000 points) on the whole object.
Very short exposure time ensures moving object.
SID4 HR compactness gives an ease of implementation on fabrication process already existing.
SID4-High Resolution wave front sensor is adapted for optical metrology needs. It associates the SID4 ease of implementation with ultra high resolution. Dedicated to optical components metrology (lens, objective, aspheric, microlens characterisation,...), it allows sampling on a phase map of 300x400 measurement points and to access high precision.
SID4 HR genuine features
